Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C.

Author(s)

• IEEE International Workshop on IDDQ Testing
• Tong, Carol
• Jayasumana, Anura P.
• IEEE Computer Society. Technical Committee on Test Technology

Bibliographic Information

Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C.

edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press, c1996

Other Title

1996 IEEE International Workshop on IDDQ Testing

IEEE International Workshop on IDDQ Testing

IDDQ 96

96TB100067

Note

"IEEE Computer Society Press order number PR07655"--T.p. verso

"IEEE order plan catalog number 96TB100067"--T.p. verso

Includes bibliographical references

Details

• NCID: BA42650538
• ISBN:
  • 0818676558
• LCCN: 96077320
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: ix, 105 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871.99.M44
  • DC21 : 621.39/732
• Subject Headings:
  • LCSH : Iddq testing -- Congresses
  • LCSH : Metal oxide semiconductors, Complementary -- Testing -- Congresses