ID:DA10231349
IEEE Computer Society. Technical Committee--Test Technology
IEEE Computer Society. Test Technology Technical Committee
同姓同名の著者を検索
sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology
IEEE Computer Society Press c2000
: pbk
所蔵館5館
sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, Association for Computing Machinery SIGSIM
IEEE Computer Society c1999
所蔵館4館
sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University
IEEE Computer Society Press c1998
所蔵館3館
sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIM ; proceedings editor, Jürgen Becker ; program chair, Mangred Glesner ; workshop char, Rudy Lauwereins
sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]
IEEE Computer Society Press c1997
edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology
所蔵館1館
sponsored by the IEEE Computer Society Technical Committee on Test Technology, National Tsing Hua University
IEEE Computer Society Press c1996
所蔵館2館
edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology
sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section
所蔵館6館
sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIM
sponsored by the IEEE Computer Society's Technical Committee on Test Technology and the VLSI Society of India (VSI)
IEEE Computer Society Press c1995
pbk.
IEEE Computer Society Press c1994
sponsored by the IEEE Computer Society, Technical Committee-Test Technology and the Philadelphia Section of the IEEE
IEEE Computer Society Press c1993
: soft. , : micro.