Proceedings : International Workshop on Memory Technology, Design, and Testing

Author(s)

• IEEE International Workshop on Memory Technology, Design, and Testing
• Lombardi, Fabrizio
• Rajsuman, Rochit
• Wik, Thomas
• IEEE Computer Society. Test Technology Technical Committee
• IEEE Computer Society. Technical Committee on VLSI

Bibliographic Information

Proceedings : International Workshop on Memory Technology, Design, and Testing

edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press, c1997

Other Title

97TB100159

Memory Technology, Design and Testing

MTDT'97

Note

"August 11-12, 1997, San Jose, California"--Cover

"IEEE Order Plan Catalog Number 97TB100159"--T.p. verso

"IEEE Computer Society Order Number PR08099"--T.p. verso

Includes bibliographical references and index

Description and Table of Contents

Description

This text on computer hardware, design and technology should appeal to computing professionals and students.

by "Nielsen BookData"

Details

• NCID: BA43222846
• ISBN:
  • 0818680997
• LCCN: 97202128
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: ix, 103 p.
• Size: 28 cm
• Classification:
  • LCC : TK7895.M4
  • DC21 : 621.39/732
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses