Digest of papers, IEEE International Workshop on IDDQ Testing : November 5-6, 1997, Washington, D.C.

Author(s)

• IEEE International Workshop on IDDQ Testing
• Jayasumana, Anura P.
• IEEE Computer Society. Technical Committee on Test Technology

Bibliographic Information

Digest of papers, IEEE International Workshop on IDDQ Testing : November 5-6, 1997, Washington, D.C.

edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press, c1997

Other Title

IDDQ testing

97TB100169

Note

"IEEE Computer Society order number PR08123"--T.p. verso

"IEEE order plan catalog number 97TB100169"--T.p. verso

Includes bibliographic references and index

Description and Table of Contents

Description

This volume contains papers from the 1997 IEEE International Workshop on IDDQ testing.

by "Nielsen BookData"

• NCID: BA43487068
• ISBN:
  • 0818681233
• LCCN: 97072789
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: ix, 119 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871.99.M44
  • DC21 : 621.39/5/0287
• Subject Headings:
  • LCSH : Iddq testing -- Congresses
  • LCSH : Metal oxide semiconductors, Complementary -- Testing -- Congresses