Digest of papers, IEEE International Workshop on IDDQ Testing : November 5-6, 1997, Washington, D.C.

著者

• IEEE International Workshop on IDDQ Testing
• Jayasumana, Anura P.
• IEEE Computer Society. Technical Committee on Test Technology

書誌事項

Digest of papers, IEEE International Workshop on IDDQ Testing : November 5-6, 1997, Washington, D.C.

edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press, c1997

タイトル別名

IDDQ testing

97TB100169

注記

"IEEE Computer Society order number PR08123"--T.p. verso

"IEEE order plan catalog number 97TB100169"--T.p. verso

Includes bibliographic references and index

内容説明・目次

内容説明

This volume contains papers from the 1997 IEEE International Workshop on IDDQ testing.

「Nielsen BookData」 より

• NII書誌ID(NCID): BA43487068
• ISBN:
  • 0818681233
• LCCN: 97072789
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: ix, 119 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871.99.M44
  • DC21 : 621.39/5/0287
• 件名:
  • LCSH : Iddq testing -- Congresses
  • LCSH : Metal oxide semiconductors, Complementary -- Testing -- Congresses