1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

Author(s)

• International Workshop on Statistical Metrology
• IEEE Electron Devices Society
• 応用物理学会 オウヨウ ブツリ ガッカイ

Bibliographic Information

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics ... [et al.]

Institute of Electrical and Electronics Engineers, c1997

Other Title

97TH8246

Note

"IEEE cat. no. 97TH8246."

Includes bibliographical references

Details

• NCID: BA43633578
• ISBN:
  • 0780337379
• LCCN: 96079035
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [New York]
• Pages/Volumes: vi, 124 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871.85
• Subject Headings:
  • LCSH : Semiconductors -- Characterization -- Statistical methods -- Congresses
  • LCSH : Semiconductors -- Measurement -- Congresses