ID:DA12290655
Workshop on Statistical Metrology, International
IWSM
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technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI Symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers
Institute of Electrical and Electronics Engineers c2001
: soft.
Available at 1 libraries
[sponsored by] The IEEE Electron Devices Society
Institute of Electrical and Electronics Engineers c2000
: pbk
Business Center for Academic Societies Japan [1999]
:softbound
Available at 2 libraries
IEEE Electron Devices Society
Institute of Electrical and Electronics Engineers c1998
:softbound , :microfiche
sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics ... [et al.]
Institute of Electrical and Electronics Engineers c1997
