Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado

著者

• Fineschi, Silvano
• Woodgate, Bruce
• Kimble, Randy Alan
• Society of Photo-optical Instrumentation Engineers

書誌事項

Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado

Silvano Fineschi, Bruce E. Woodgate, Randy A. Kimble, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3764）

SPIE, c1999

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA45717599
• ISBN:
  • 0819432504
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vii, 288 p.
• 大きさ: 28 cm
• 分類:
  • LCC : QB468
  • DC20 : 522/.65
• 件名:
  • LCSH : Polarimetry -- Congresses
  • LCSH : X-ray astronomy -- Instruments -- Congresses
  • LCSH : Ultraviolet astronomy -- Instruments -- Congresses
• 親書誌ID:
  • BA0022700X