Proceedings : 1998 GaAs Reliability Workshop , November 1, 1998, Atlanta, Georgia

著者

• GaAs Reliability Workshop
• JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
• IEEE Electron Devices Society

書誌事項

Proceedings : 1998 GaAs Reliability Workshop , November 1, 1998, Atlanta, Georgia

sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Device Society of the Institute of Electrical and Electronics Engineers, Inc

IEEE Service Center, [c1998]

• :softbound
• :microfiche

タイトル別名

EIA GaAs Reliability Workshop Proceedings

98EX219

注記

"IEEE catalog number: 98EX219"--Cover p. [2]

Includes bibliographical references

内容説明・目次

内容説明

This volume presents results and developments in all phases of GaAs reliability of control applications. Topics include: qualification methodologies; reliability testing and failure mechanisms; and measurement techniques and device simulation.

「Nielsen BookData」 より

• NII書誌ID(NCID): BA46679269
• ISBN:
  • 0790800659
  • 0780350677
• LCCN: 98193590
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway
• ページ数/冊数: vii, 105 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871.15.G3
  • DC21 : 621.3815/2
• 件名:
  • LCSH : Gallium arsenide semiconductors -- Reliability -- Congresses
  • LCSH : Bipolar transistors -- Reliability -- Congresses
  • LCSH : Accelerated life testing -- Congresses