Proceedings : 18th IEEE VLSI Test Symposium, 30 April-4 May, 2000, Montréal, Québec, Canada

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

Proceedings : 18th IEEE VLSI Test Symposium, 30 April-4 May, 2000, Montréal, Québec, Canada

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2000

Other Title

18th IEEE VLSI Test Symposium

VTS00

PR00613

Note

Includes bibliographical references and index

IEEE Computer Society order number: PR00613

Description and Table of Contents

Description

These papers constitute the proceedings of the IEEE VLSI Test Symposium 2000. Subjects covered include: microprocessor test/validation; low power BIST and scan; defect driven techniques; analogue test techniques; temperature and process drift issues; and more.

by "Nielsen BookData"

Details

• NCID: BA47892680
• ISBN:
  • 0769506135
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif. ; Tokyo
• Pages/Volumes: xxxix, 478 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses