Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore]

著者

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Radhakrishnan, M. K.
• Ho, Philip
• Chim, Wai Kin
• IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• IEEE Electron Devices Society
• National University of Singapore. Centre for IC Failure Analysis and Reliability
• Institute of Microelectronics,Singapore

書誌事項

Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore]

edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Device Society ; in co-operation with National University of Singapore Centre for IC Failure Analysis & Reliability, Institute of Microelectronics,Singapore

Institute of Electrical and Electronics Engineers, c1997

• softbound

タイトル別名

6th International Symposium on the Physical & Failure Analysis of Integrated Circuites

6th International Symposium on the Physical & Failure Analysis of Integrated Circuits 1997

IPFA '97

97TH8289

注記

"IPFA '97 proceedings"--Cover

"IEEE catalog number 97TH8289"

Includes bibliographic references and author index

詳細情報

• NII書誌ID(NCID): BA48398384
• ISBN:
  • 0780339851
• LCCN: 97072002
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: [xi], 301, [5] p.
• 大きさ: 30 cm
• 分類:
  • LCC : TK7874
  • DC21 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Defects -- Congresses
  • LCSH : Integrated circuits -- Testing -- Congresses