Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA

著者

• IEEE International Workshop on Memory Technology, Design, and Testing
• Rajsuman, Rochit
• Wik, T.
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid State Circuits Society

書誌事項

Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA

edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits Society

Institute of Electrical and Electronics Engieers, c1999

タイトル別名

PR00259

Memory Technology, Design and Testing

MTDT'99

注記

"IEEE Order Plan Catalog Number PR00259"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA48495198
• ISBN:
  • 0769502598
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: ix, 131 p.
• 大きさ: 28 cm