Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA

著者

• IEEE International Workshop on Memory Technology, Design, and Testing
• Rajsuman, Rochit
• Wik, T.
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid State Circuits Society

書誌事項

Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA

edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits Society

Institute of Electrical and Electronics Engieers, c1999

タイトル別名

PR00259

Memory Technology, Design and Testing

MTDT'99

注記

"IEEE Order Plan Catalog Number PR00259"--T.p. verso

Includes bibliographical references and index

内容説明・目次

内容説明

This work provides researchers, professors, practitioners, students, designers and other computing professionals with information on embedded memory design aids, embedded DRAM, algorithms and testing techniques and memory repair.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA48495198
• ISBN:
  • 0769502598
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: ix, 131 p.
• 大きさ: 28 cm