Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA

Author(s)

• IEEE International Workshop on Memory Technology, Design, and Testing
• Rajsuman, Rochit
• Wik, T.
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid State Circuits Society

Bibliographic Information

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA

edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits Society

Institute of Electrical and Electronics Engieers, c2000

• :case.

Other Title

PR00689

Memory Technology, Design and Testing

MTDT 2000

Note

"IEEE Computer Society Order Number PR00689"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA48496452
• ISBN:
  • 0769506895
  • 0769506909
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: x, 131 p.
• Size: 28 cm