Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA

著者

• IEEE International Workshop on Memory Technology, Design, and Testing
• Rajsuman, Rochit
• Wik, T.
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid State Circuits Society

書誌事項

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA

edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits Society

Institute of Electrical and Electronics Engieers, c2000

• :case.

タイトル別名

PR00689

Memory Technology, Design and Testing

MTDT 2000

注記

"IEEE Computer Society Order Number PR00689"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA48496452
• ISBN:
  • 0769506895
  • 0769506909
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: x, 131 p.
• 大きさ: 28 cm