1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997

Author(s)

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997

sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

IEEE Electron Devices Society : IEEE Reliability Society, c1997

• :softbound

Other Title

97TH8319

Note

"IEEE Catalog No. 97TH8319"--verso of T.p

Includes bibliographical references

Details

• NCID: BA48552666
• ISBN:
  • 0780342054
• LCCN: 97080028
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: vii, 161 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC21 : 621.3815
• Subject Headings:
  • LCSH : Integrated circuits -- Reliability -- Congresses
  • LCSH : Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses