1998 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1998 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998

sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

IEEE Electron Devices Society : IEEE Reliability Society, c1998

• :softbound

タイトル別名

98TH8363

注記

"IEEE Catalog No. 98TH8363"--verso of T.p.

Includes bibliographical references

内容説明・目次

内容説明

The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics include: contributors to failure; waver level reliability; building in reliability; and reliability test structures.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA48553024
• ISBN:
  • 0780348818
• LCCN: 98084868
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: vi, 140 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC21 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Reliability Congresses
  • LCSH : Integrated circuits -- Wafer-scale integration -- Reliability Congresses