1999 4th International Workshop on Statistical Metrology, June 12, 1999, Kyoto

Author(s)

• International Workshop on Statistical Metrology
• IEEE Electron Devices Society
• VLSI Symposium
• 応用物理学会 オウヨウ ブツリ ガッカイ
• IEEE Electron Devices. Tokyo Chapter
• 電子情報通信学会 デンシ ジョウホウ ツウシン ガッカイ

Bibliographic Information

1999 4th International Workshop on Statistical Metrology, June 12, 1999, Kyoto

technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI Symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers

Business Center for Academic Societies Japan, [1999]

• :softbound

Other Title

IWSM

99TH8391

Note

"IEEE cat. no. 99TH8391."--T.p. verso

Includes bibliographical references

Details

• NCID: BA48946730
• ISBN:
  • 0780351541
• LCCN: 98088036
• Country Code: ja
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Tokyo, Japan
• Pages/Volumes: vi, 65 p.
• Size: 28 cm