Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

著者

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Chim, Wai Kin
• Radhakrishnan, M. K.
• Thong, John T. L.
• IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• IEEE Electron Devices Society
• National University of Singapore. Centre for IC Failure Analysis and Reliability
• Institute of Microelectronics

書誌事項

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore

Institute of Electrical and Electronics Engineers, c1999

• :softbound

タイトル別名

99TH8394

7th International Symposium on th Physical & Failure Analysis of Integrated Circuits 1999

IPFA '99

注記

"IEEE catalog number 99TH8394"--T.p. verso

"5-9 July, 1999, Orchard Hotel, Singapore"--Cover

Includes bibliographical references and index

内容説明・目次

内容説明

Aimed at integrated circuit designers, solid state component designers and packaging and manufacturing engineers, these proceedings cover such subjects as: failure analysis technologies; process and device; packaging and metallization; dielectrics; and reliability of specialist devices.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA48948612
• ISBN:
  • 0780351878
• LCCN: 98088539
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: 209 p.
• 大きさ: 30 cm