Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author(s)
Bibliographic Information
Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Institute of Electrical and Electronics Engineers, c1999
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- Other Title
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99TH8394
7th International Symposium on th Physical & Failure Analysis of Integrated Circuits 1999
IPFA '99
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Note
"IEEE catalog number 99TH8394"--T.p. verso
"5-9 July, 1999, Orchard Hotel, Singapore"--Cover
Includes bibliographical references and index
Description and Table of Contents
Description
Aimed at integrated circuit designers, solid state component designers and packaging and manufacturing engineers, these proceedings cover such subjects as: failure analysis technologies; process and device; packaging and metallization; dielectrics; and reliability of specialist devices.
by "Nielsen BookData"