Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA

著者

• Goldstein, Dennis H.
• Chenault, David B.
• Duggin, Michael J.
• Egan, Walter G.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA

David B. Chenault, Michaek J. Duggin, Walter G. Egan, Dennis H. Goldstein, chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4133）

SPIE, c2000

詳細情報

• NII書誌ID(NCID): BA49669057
• ISBN:
  • 0819437786
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: ix, 302 p.
• 大きさ: 28 cm
• 分類:
  • LCC : QC443
  • DC20 : 535.52/0287
• 件名:
  • LCSH : Polarimetry -- Congresses
• 親書誌ID:
  • BA0022700X