書誌事項

Electron microscopy and analysis

Peter J. Goodhew, John Humphreys, Richard Beanland

Taylor & Francis, 2001

3rd ed

  • : pbk

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注記

Includes bibliographical references (p. [236]-237) and index

内容説明・目次

内容説明

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

目次

  • Preface
  • Abbreviations
  • 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques
  • Further Reading
  • Index

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詳細情報

  • NII書誌ID(NCID)
    BA50327447
  • ISBN
    • 0748409688
  • LCCN
    00037716
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    London
  • ページ数/冊数
    x, 251 p.
  • 大きさ
    24 cm
  • 分類
  • 件名
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