LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey

Author(s)

• Semiconductor Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey

sponsored by IEEE Computer Society, Test Technology Committee and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office, c1978

Note

Includes bibliographical references

Details

• NCID: BA50509229
• LCCN: 78113233
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York,Long Beach, Calif.
• Pages/Volumes: ii, 301 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/73042
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Integrated circuits -- Large scale integration -- Congresses
  • LCSH : Printed circuits -- Testing -- Congresses