LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey

著者

• Semiconductor Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey

sponsored by IEEE Computer Society, Test Technology Committee and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office, c1978

注記

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA50509229
• LCCN: 78113233
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York,Long Beach, Calif.
• ページ数/冊数: ii, 301 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/73042
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Integrated circuits -- Large scale integration -- Congresses
  • LCSH : Printed circuits -- Testing -- Congresses