LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey

著者

• Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey

sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office, c1979

注記

"79CH1509-9C."

Includes bibliographical references

• NII書誌ID(NCID): BA50510159
• LCCN: 80114249
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, N.Y.,Long Beach, Calif.
• ページ数/冊数: ii, 382 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/7/0287
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Integrated circuits -- Large scale integration -- Congresses
  • LCSH : Printed circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses