LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey

Author(s)

• Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey

sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office, c1979

Note

"79CH1509-9C."

Includes bibliographical references

Details

• NCID: BA50510159
• LCCN: 80114249
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, N.Y.,Long Beach, Calif.
• Pages/Volumes: ii, 382 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/7/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Integrated circuits -- Large scale integration -- Congresses
  • LCSH : Printed circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses