Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

Author(s)

• Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office, c1980

Note

"IEEE Catalog Number 80CH1608-9."

Includes bibliographical references and index

Details

• NCID: BA50510567
• LCCN: 80083501
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, N.Y.,Long Beach, Calif.
• Pages/Volumes: xv, 507 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/73/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses