Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

著者

• Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office, c1980

注記

"IEEE Catalog Number 80CH1608-9."

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA50510567
• LCCN: 80083501
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, N.Y.,Long Beach, Calif.
• ページ数/冊数: xv, 507 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/73/0287
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses