Transmission electron microscopy and diffractometry of materials

著者

• Fultz, B.
• Howe, James M.

書誌事項

Transmission electron microscopy and diffractometry of materials

Brent Fultz, James Howe

Springer, 2001

注記

Includes bibliographical references and index

内容説明・目次

内容説明

This text covers the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and advanced-level material, using over 400 accompanying illustrations. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail.

目次

Diffraction Geometry and the X-Ray Powder Diffractometer.- The TEM and Its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High Resolution TEM Imaging.- Dynamical Theory.- Appendix.

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詳細情報

• NII書誌ID(NCID): BA50935635
• ISBN:
  • 3540678417
• LCCN: 00049275
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Berlin ; Tokyo
• ページ数/冊数: xix, 748 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA417.23
  • DC21 : 620.1/1299
• 件名:
  • LCSH : Materials -- Microscopy
  • LCSH : Transmission electron microscopy
  • LCSH : X-ray diffractometer