Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts

Author(s)

• Batchelor, Bruce G.
• Miller, John W. V.
• Solomon, Susan Snell
• Society of Photo-optical Instrumentation Engineers
• Machine Vision Association of SME

Bibliographic Information

Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts

chairs/editors: Bruce G. Batchelor, John W.V. Miller, Susan Snell Soloman ; sponsored by SPIE - the International Society for Optical Engineering ; endorsed by MVA/SME - Machine Vision Association of the Society of Manufacturing Engineers

（Proceedings / SPIE -- the International Society for Optical Engineering, Vol. 3521）

SPIE, c1998

Note

Includes bibliographical references and index

Details

• NCID: BA50959622
• ISBN:
  • 0819429821
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham
• Pages/Volumes: xi, 386 p.
• Size: 28 cm.
• Classification:
  • LCC : TA1634
  • DC21 : 670.42/5
• Subject Headings:
  • LCSH : Computer vision -- Congresses
  • LCSH : Engineering inspection -- Automation -- Congresses
  • LCSH : Optical measurements -- Congresses
  • LCSH : Computer vision -- Industrial applications -- Congresses
• Parent Bibliography ID:
  • BA0022700X