Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)

SPIE c2003 Proceedings / SPIE -- the International Society for Optical Engineering v. 5132

所蔵館1館

Susan Snell Soloman, Bruce G. Batchelor, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers ; cooperating organizations, NIST--National Institute of Standards and Technology, CIMS--Coalition for Intelligent Manufacturing Systems, [and] A-CIMS--Academic Coalition for Intelligent Manufacturing Systems

SPIE c1997 Proceedings / SPIE -- the International Society for Optical Engineering v. 3205

所蔵館1館

sponsored by Society of Manufacturing Engineers [and] Machine Vision Association of SME

Society of Manufacturing Engineers c1989

所蔵館15館

sponsored by MVA

Machine Vision Association of SME , Distributed outside the U.S. and Canada by, North-Holland, a division of Elsevier Science Publishers c1986 , c1986 1st ed.

: North-Holland

所蔵館7館