Proceedings of the Ninth Asian Test Symposium (ATS 2000), December 4-6, 2000, Taipei, Taiwan
著者
書誌事項
Proceedings of the Ninth Asian Test Symposium (ATS 2000), December 4-6, 2000, Taipei, Taiwan
IEEE Computer Society Press, c2000
- :case
- タイトル別名
-
PR00887
ATS 2000
Proceedings of the ninth Asian Test Symposium
大学図書館所蔵 件 / 全1件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
"IEEE Computer Society Order Number PR00887"
Includes bibliographies and index
内容説明・目次
内容説明
These conference proceedings cover such topics as: analogue and mixed signal tests; memory built-in self-test and self-diagnosis; fault simulation and timing simulation; fault analysis; test generation; functional testing; and memory testing.
目次
- Analog and Mixed Signal Test
- Memory Built-In Self-Test and Self-Diagnosis
- Fault Simulation & Timing Simulation
- Fault Analysis
- Test Generation
- Functional Testing
- Built-In Self-Test
- Software Testing and Test Synthesis
- Embedded-Core Testing
- Memory Testing
- IDDQ Testing
- Testability Analysis and Design for Testability
- Fault Tolerance
- Low-Power Testing
- Self-Checking Circuits
「Nielsen BookData」 より
