Proceedings of the Ninth Asian Test Symposium (ATS 2000), December 4-6, 2000, Taipei, Taiwan
著者
書誌事項
Proceedings of the Ninth Asian Test Symposium (ATS 2000), December 4-6, 2000, Taipei, Taiwan
IEEE Computer Society Press, c2000
- :case
- タイトル別名
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PR00887
ATS 2000
Proceedings of the ninth Asian Test Symposium
大学図書館所蔵 全1件
注記
"IEEE Computer Society Order Number PR00887"
Includes bibliographies and index
内容説明・目次
内容説明
These conference proceedings cover such topics as: analogue and mixed signal tests; memory built-in self-test and self-diagnosis; fault simulation and timing simulation; fault analysis; test generation; functional testing; and memory testing.
目次
- Analog and Mixed Signal Test
- Memory Built-In Self-Test and Self-Diagnosis
- Fault Simulation & Timing Simulation
- Fault Analysis
- Test Generation
- Functional Testing
- Built-In Self-Test
- Software Testing and Test Synthesis
- Embedded-Core Testing
- Memory Testing
- IDDQ Testing
- Testability Analysis and Design for Testability
- Fault Tolerance
- Low-Power Testing
- Self-Checking Circuits
「Nielsen BookData」 より