Proceedings, 19th IEEE VLSI Test Symposium : VTS 2001 : April 29-3 May 2001, Marina Del Rey, California USA

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Proceedings, 19th IEEE VLSI Test Symposium : VTS 2001 : April 29-3 May 2001, Marina Del Rey, California USA

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2001

• : [soft.]
• : case.

Other Title

PR01122

Note

Includes bibliographical references and index

"IEEE Computer Society Press order number PR01122" -- T. p. verso

Details

• NCID: BA52510320
• ISBN:
  • 0769511228
  • 0769511236
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxxiii, 417 p.
• Size: 28 cm
• Classification:
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses