Proceedings, 19th IEEE VLSI Test Symposium : VTS 2001 : April 29-3 May 2001, Marina Del Rey, California USA

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Proceedings, 19th IEEE VLSI Test Symposium : VTS 2001 : April 29-3 May 2001, Marina Del Rey, California USA

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2001

• : [soft.]
• : case.

タイトル別名

PR01122

注記

Includes bibliographical references and index

"IEEE Computer Society Press order number PR01122" -- T. p. verso

内容説明・目次

内容説明

Topics include: BIST techniques; diagnosis methods; test data compression; synthesis and design for testability; diagnosis and verification ATPG; defect analysis and IDDx diagnosis; SoC testing; self-test techniques; memory diagnosis; novel ATPG techniques; fault modelling and BIST evaluation.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA52510320
• ISBN:
  • 0769511228
  • 0769511236
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxxiii, 417 p.
• 大きさ: 28 cm
• 分類:
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses