Electron beam ion sources and traps and their applications : eighth international symposium EBIS/T 2000, Upton, N.Y. 5-8 November 2000

Author(s)

• International Symposium on Electron Beam Ion Sources and Traps and Their Applications (2000 : Upton, N.Y.)
• Prelec, Krsto

Bibliographic Information

Electron beam ion sources and traps and their applications : eighth international symposium EBIS/T 2000, Upton, N.Y. 5-8 November 2000

editor, Krsto Prelec

（AIP conference proceedings, no. 572）

American Institute of Physics, c2001

Note

Includes bibliographical references

Details

• NCID: BA53573519
• ISBN:
  • 0735400113
• LCCN: 01091142
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Melville, New York
• Pages/Volumes: xiv, 304 p.
• Size: 25 cm
• Parent Bibliography ID:
  • BA00284604