Electron beam ion sources and traps and their applications : eighth international symposium EBIS/T 2000, Upton, N.Y. 5-8 November 2000
著者
書誌事項
Electron beam ion sources and traps and their applications : eighth international symposium EBIS/T 2000, Upton, N.Y. 5-8 November 2000
（AIP conference proceedings, no. 572）
American Institute of Physics, c2001
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注記
Includes bibliographical references
内容説明・目次
内容説明
This symposium is a triennial event, held in different places around the world (next symposium will be in Japan, in 2003). The topic of the symposium is the development of electron beam ion sources and traps and their applications, so far in basic science and research, but with prospects for extending them into other areas. Potential readers would have an interest in atomic physics and applications to accelerator physics.
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