書誌事項

Concepts and techniques

Xiao-Feng Zhang, Ze Zhang (Eds.)

(Springer series in surface sciences, 38 . Progress in transmission electron microscopy ; 1)

Springer, c2001

大学図書館所蔵 件 / 24

この図書・雑誌をさがす

注記

Includes bibliographical references (p. 352-361) and index

内容説明・目次

内容説明

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications.

目次

1 The Modern Microscope Today.- 2 The Quest for Ultra-High Resolution.- 3 Z-Contrast Imaging in the Scanning Transmission Electron Microscope.- 4 Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging.- 5 Quantitative Analysis of High-Resolution Atomic Images.- 6 Electron Crystallography-Structure determination by combining HREM, Crystallographic image processing and electron diffraction.- 7 Electron Amorphography.- 8 Weak-Beam Electron Microscopy.- 9 Point Group and Space Group Identification by Convergent Beam Electron Diffraction.- 10 Advanced Techniques in TEM Specimen Preparation.

「Nielsen BookData」 より

関連文献: 1件中  1-1を表示

詳細情報

ページトップへ