2001 IEEE International Symposium on Semiconductor Manufacturing : conference proceedings, October 8-10, 2001, San Jose, California

書誌事項

2001 IEEE International Symposium on Semiconductor Manufacturing : conference proceedings, October 8-10, 2001, San Jose, California

[sponsored by IEEE Electron Devices Society, IEEE Components Packaging and Manufacturing Technology Society, Semiconductor Equipment & Materials International (SEMI), and Society of Applied Physics of Japan]

IEEE Service Center, c2001

  • : softbound

タイトル別名

01CH37203

2001 IEEE International Symposium on Semiconductor Manufacturing, ISSM 2001, conference proceedings, October 8-10, 2001, San Jose, Colifornia

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注記

Includes bibliographical references

"IEEE catalog number 01CH37203"--T.p. verso

内容説明・目次

内容説明

Topics covered in this volume include: factory design; manufacturing strategy and management; manufacturing control and execution; yield enhancement methodology; ultraclean technology; environment, safety and health; process and metrology equipment; and process and material optimization.

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詳細情報

  • NII書誌ID(NCID)
    BA5444336X
  • ISBN
    • 0780367316
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Piscataway, N.J.
  • ページ数/冊数
    xi, 525 p.
  • 大きさ
    28 cm
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