Defects, recognition, imaging and physics in semiconductors, 1999 : proceedings of the eighth International Conference on Defects, Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999

著者

• International Conference on Defects, Recognition, Imaging and Physics in Semiconductors
• 小川, 智哉 オガワ, トモヤ
• 田島, 道夫 タジマ, ミチオ

書誌事項

Defects, recognition, imaging and physics in semiconductors, 1999 : proceedings of the eighth International Conference on Defects, Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999

edited by T. Ogawa, M. Tajima

（Journal of crystal growth, v. 210/1-3）

North-Holland : Elsevier, c2000

注記

"Special issue of Journal of crystal growth volume 210/1-3"--Back cover

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA54472222
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam ; Tokyo
• ページ数/冊数: xii, 420 p.
• 大きさ: 27 cm
• 親書誌ID:
  • BA07743980