Proceedings : 10th anniversary compendium of papers from Asian Test Symposium, 1992-2001

著者

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council
• Tenth Anniversary Committee of Asian Test Symposium

書誌事項

Proceedings : 10th anniversary compendium of papers from Asian Test Symposium, 1992-2001

sponsored by IEEE Computer Society Test Technology Technical Council, Tenth Anniversary Committee of Asian Test Symposium

IEEE Computer Society, c2001

• : case

タイトル別名

ATS 2001 : compendium

PR01233

注記

"IEEE Computer Society Order Number PR01233"--on T.p. verso

Includes bibliographical references and index

内容説明・目次

内容説明

Fifty-five papers are collected from ten years of meetings of the Asian Test Symposium, an international forum that discusses aspects of system, board, chip, and device testing in light of design, manufacturing, and field considerations. Specific topics include a concurrent fault detection method fo

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA54682520
• ISBN:
  • 076951233X
  • 0769512348
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xii, 374 p.
• 大きさ: 28 cm