Proceedings : 10th anniversary compendium of papers from Asian Test Symposium, 1992-2001

Author(s)

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council
• Tenth Anniversary Committee of Asian Test Symposium

Bibliographic Information

Proceedings : 10th anniversary compendium of papers from Asian Test Symposium, 1992-2001

sponsored by IEEE Computer Society Test Technology Technical Council, Tenth Anniversary Committee of Asian Test Symposium

IEEE Computer Society, c2001

• : case

Other Title

ATS 2001 : compendium

PR01233

Note

"IEEE Computer Society Order Number PR01233"--on T.p. verso

Includes bibliographical references and index

Description and Table of Contents

Description

Fifty-five papers are collected from ten years of meetings of the Asian Test Symposium, an international forum that discusses aspects of system, board, chip, and device testing in light of design, manufacturing, and field considerations. Specific topics include a concurrent fault detection method fo

by "Nielsen BookData"

Details

• NCID: BA54682520
• ISBN:
  • 076951233X
  • 0769512348
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xii, 374 p.
• Size: 28 cm