Proceedings : 10th Asian Test Symposium, 19-21 November 2001, Kyoto, Japan

著者

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council
• Technical Group on Fault Tolerant Systems

書誌事項

Proceedings : 10th Asian Test Symposium, 19-21 November 2001, Kyoto, Japan

sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Technical Group on Fault Tolerant Systems ... [et al.]

IEEE Computer Society, c2001

• : case

タイトル別名

Proceedings of the tenth Asian Test Symposium

ATS 2001

PR01378

注記

"IEEE Computer Society Order Number PR01378"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA54688312
• ISBN:
  • 0769513786
  • 0769513794
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxvi, 473 p.
• 大きさ: 28 cm