Accuracy in trace analysis : sampling, sample handling analysis : proceedings of the 7th materials research symposium

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Accuracy in trace analysis : sampling, sample handling analysis : proceedings of the 7th materials research symposium

Philip D. LaFleur, editor

（NBS special publication, 422）

NBS Special Publication, 1976

  • v. 1
  • v. 2

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注記

Held at the National Bureau of Standards Gaithersburg, Md., October 7-11, 1974

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  • NBS special publication

    Planning Office, National Bureau of Standards, U.S. Dept. of Commerce , For sale by the Supt. of Docs., U.S. Govt. Print. Off

    426, Suppl. 1

    所蔵館1館

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