Proceedings, 20th IEEE VLSI Test Symposium (VTS 2002) : 28 April-2 May 2002, Monterey, California

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

Proceedings, 20th IEEE VLSI Test Symposium (VTS 2002) : 28 April-2 May 2002, Monterey, California

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2002

Other Title

PR01570

Note

Includes bibliographical references and index

"IEEE Computer Society Press order number PR01570" -- T. p. verso

Details

• NCID: BA5705997X
• ISBN:
  • 0769515703
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxxvii, 452 p.
• Size: 28 cm
• Classification:
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses