Proceedings, 20th IEEE VLSI Test Symposium (VTS 2002) : 28 April-2 May 2002, Monterey, California

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

書誌事項

Proceedings, 20th IEEE VLSI Test Symposium (VTS 2002) : 28 April-2 May 2002, Monterey, California

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2002

タイトル別名

PR01570

注記

Includes bibliographical references and index

"IEEE Computer Society Press order number PR01570" -- T. p. verso

内容説明・目次

内容説明

This volume originates from the 20th IEEE VLSI Test Symposium, and is concerned with computer engineering. It is aimed at researchers, professors, practitioners and students.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA5705997X
• ISBN:
  • 0769515703
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxxvii, 452 p.
• 大きさ: 28 cm
• 分類:
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses