Boundary-scan interconnect diagnosis

著者

書誌事項

Boundary-scan interconnect diagnosis

by José T. De Sousa and Peter Y.K. Cheung

(Frontiers in electronic testing)

Kluwer Academic Publisher, c2001

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

This pioneering text explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. It takes a new approach, carefully modelling circuit and interconnect faults, and applying graph techniques to solve problems.

目次

Foreword. Preface. Acknowledgments. 1. Introduction. 2. Interconnect Circuit and Fault Models. 3. Behavioral Interconnect Diagnosis. 4. Structural Interconnect Diagnosis. 5. Diagnostic Resolution Assessment. 6. Experimental Results. 7. Conclusion. Appendices. References. Acronyms and abbreviations. Notation. About the authors. Index.

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詳細情報

  • NII書誌ID(NCID)
    BA57325097
  • ISBN
    • 0792373146
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Boston
  • ページ数/冊数
    xxi, 168 p.
  • 親書誌ID
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