Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
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Bibliographic Information
Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
（Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler, v. 179）（Physics and astronomy online library）
Springer, c2002
Available at / 20 libraries
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
420.8:S1:1797210195819
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Hokkaido University, Library, Graduate School of Science, Faculty of Science and School of Science研究室
DC21:539.7/W2692070572470
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Note
"with 132 figures"
Includes bibliographical references and index
