Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
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Bibliographic Information
Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
（Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler, v. 179）（Physics and astronomy online library）
Springer, c2002
Available at / 19 libraries
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
420.8:S1:1797210195819
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Hokkaido University, Library, Graduate School of Science, Faculty of Science and School of Science研究室
DC21:539.7/W2692070572470
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Note
"with 132 figures"
Includes bibliographical references and index
Description and Table of Contents
Description
The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys", have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions.
Table of Contents
Structural Characterization of Crystalline and Non-crystalline Materials - A Brief Background of Current Requirements.- Experimental Determination of Partial and Environmental Structure Functions in Non-crystalline Systems - Fundamental Aspects.- Nature of Anomalous X-ray Scattering and Its Application to the Structural Analysis of Crystalline and Non-crystalline Systems.- Experimental Determination of the Anomalous Dispersion Factors of X-rays - Theoretical and Experimental Issues.- In-House Equipment and Synchrotron Radiation Facilities for Anomalous X-ray Scattering.- Selected Examples of Structural Determination for Crystalline Materials Using the AXS Method.- Selected Examples of Structural Determination for Non-crystalline Materials Using the AXS Method.- Anomalous Small-Angle X-ray Scattering.- Anomalous Grazing-Incidence X-ray Reflection.- Merits of Anomalous X-ray Scattering and Its Future Prospects.
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