Surface characterization for computer disks, wafers, and flat panel displays : 28 January 1999, San Jose, California

Author(s)

• Stover, John C.

Bibliographic Information

Surface characterization for computer disks, wafers, and flat panel displays : 28 January 1999, San Jose, California

John C. Stover, chair/editor

（Proceedings / SPIE -- the International Society for Optical Engineering, 3619）

SPIE, c1999

Note

Includes bibliographical references and index

Details

• NCID: BA60546006
• ISBN:
  • 0819430897
• LCCN: 00502127
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 136 p.
• Size: 28 cm
• Classification:
  • LCC : TK7887.8.D37
  • DC21 : 621.3815/2
• Subject Headings:
  • LCSH : Data disk drives -- Congresses
  • LCSH : Surfaces (Technology) -- Congresses
  • LCSH : Semiconductor wafers -- Congresses
  • LCSH : Electroluminescent display systems -- Congresses
• Parent Bibliography ID:
  • BA0022700X