Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts

著者

    • Miller, John W. V.
    • Solomon, Susan Snell
    • Batchelor, Bruce G.
    • Society of Photo-optical Instrumentation Engineers

書誌事項

Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts

John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3836）

SPIE, c1999

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注記

Includes bibliographic references and author index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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