Pattern recognition, chemometrics, and imaging for optical environmental monitoring : 20-21 September 1999, Boston, Massahcusetts

Author(s)

    • Siddiqu, Khalid J.
    • Eastwood, Delyle

Bibliographic Information

Pattern recognition, chemometrics, and imaging for optical environmental monitoring : 20-21 September 1999, Boston, Massahcusetts

Khalid J. Siddiqui, Delyle Eastwood, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 3854)

SPIE, c1999

Available at  / 2 libraries

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Note

Includes bibliographical references and indexes

Description and Table of Contents

Description

This work presents a selection of papers dealing with various aspects of pattern recognition, chemometrics and imaging for optical environment monitoring.

by "Nielsen BookData"

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

Details

  • NCID
    BA6063395X
  • ISBN
    • 0819434477
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Bellingham, Wash.
  • Pages/Volumes
    viii, 142 p.
  • Size
    28 cm
  • Parent Bibliography ID
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