Pattern recognition, chemometrics, and imaging for optical environmental monitoring : 20-21 September 1999, Boston, Massahcusetts

著者

• Siddiqu, Khalid J.
• Eastwood, Delyle

書誌事項

Pattern recognition, chemometrics, and imaging for optical environmental monitoring : 20-21 September 1999, Boston, Massahcusetts

Khalid J. Siddiqui, Delyle Eastwood, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3854）

SPIE, c1999

注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

This work presents a selection of papers dealing with various aspects of pattern recognition, chemometrics and imaging for optical environment monitoring.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA6063395X
• ISBN:
  • 0819434477
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: viii, 142 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X