Symposium on non-destructive testing : presented at the Fifty-fifth Annual Meeting (Fiftieth Anniversary Meeting), American Society for Testing Materials, New York, N.Y. June 26, 1952

書誌事項

Symposium on non-destructive testing : presented at the Fifty-fifth Annual Meeting (Fiftieth Anniversary Meeting), American Society for Testing Materials, New York, N.Y. June 26, 1952

(ASTM special technical publication, no. 145)

American Society for Testing Materials, c1953

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詳細情報
  • NII書誌ID(NCID)
    BA61380918
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Philadelphia, Pa.
  • ページ数/冊数
    v, 98 p.
  • 大きさ
    23 cm
  • 親書誌ID
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