Proceedings of the 11th Asian Test Symposium (ATS '02), 18-20 November 2002, Guam, USA

Author(s)

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council
• IEICE. Technical Group on Dependable Computing
• IPS Japan. Special Interest Group on System LSI Design Methodology

Bibliographic Information

Proceedings of the 11th Asian Test Symposium (ATS '02), 18-20 November 2002, Guam, USA

sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan

IEEE Computer Society, c2002

Other Title

Proceedings of the eleventh Asian Test Symposium

ATS '02

PR01825

Note

"IEEE Computer Society Order Number PR01825"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA61756208
• ISBN:
  • 0769518257
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxi, 437 p.
• Size: 28 cm