Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1981, Las Vegas, Nevada September 22-24, 1981

著者

• Electrical Overstress/Electrostatic Discharge Symposium
• IIT Research Institute

書誌事項

Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1981, Las Vegas, Nevada September 22-24, 1981

sponsored by IIT Research Institute

Reliability Analysis Center, c1982

注記

"Ordering no. EOS-3."

詳細情報

• NII書誌ID(NCID): BA6459582X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Griffiss AFB, NY.
• ページ数/冊数: v, 260 p.
• 大きさ: 28 cm